YIELD ANALYZER

Model die yield and wafer output

Compare common yield models and inspect a wafer cut map that shows gross dies, good dies, and defect losses.

Die width mm Die height mm Scribe lane X mm Scribe lane Y mm Defect density /cm2 Yield model Clustering alpha Wafer diameter mm Edge loss mm Notch keep-out mm Substrate cost $ Wafers per month

Reticle

Reticle width mm Reticle height mm Half-field exposure Auto-optimize placement Reticle offset X mm Reticle offset Y mm Show reticle shot grid Show illustrative background

Die yield -- %

Gross die / wafer -- die

Good die / wafer -- die

Good die / month -- die

Cost per good die -- USD

Full dies -- inside wafer

Defective dies -- modeled

Partial dies -- edge

Excluded dies -- keep-out

Wafer area -- substrate

Total die area -- full dies

Waste area -- remaining

Reticle Results

Die per reticle --

Reticle utilization --